Yolande Berta

Yolande Berta
yb4@gatech.edu
Graduate and Postdoctoral Education Profile

Yolande Berta has over 30 years experience in electron microscopy, including both SEM and TEM. Berta has received equipment grants from the National Science Foundation and the Office of Naval Research. She has trained thousands of electron microscopy operators. Berta has a Master’s degree in Science from the School of Materials Science and Engineering at the Georgia Institute of Technology and a Master’s degree in Biology from the University of Illinois, Champaign-Urbana. 

As the Interim Director of the Responsible Conduct of Research (RCR) Program, her responsibilities include overseeing the RCR Academic Policy for Doctoral Students and the RCR Academic Policy for Master’s Thesis Students, teaching RCR courses for graduate students, and hosting RCR workshops.

Berta has more than 15 peer-reviewed publications and has given over 15 professional presentations.

Principal Research Scientist
Electron Microscopy Coordinator
Interim Director, Responsible Conduct of Research (RCR) Program
University, College, and School/Department
Yolande
Berta
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Walter Henderson

Walter Henderson
walter.henderson@ien.gatech.edu

Walter Henderson manages a group of 8-10 research professionals that annually trains and helps ~700 researchers to perform 25000+ hours of work that enables ~$30M in research funding to Georgia Tech. 

He has significant experience in the growth, fabrication, and especially the characterization of microelectronic and nano-scale materials and devices. Henderson has been involved in this type of research since 1998 at all levels from vacuum system design and assembly to data analysis to paper and proposal writing/submission. 

Henderson has been an author on more than 30 publications in refereed publications such as the Journal of Applied Physics. His long-term goal is to move into education policy or public policy at the local or state level. 

Associate Director, Materials Characterization Facility
Principal Research Scientist
Phone
404.894.4702
Additional Research

Specialties: Structural, chemical, electrical and optical characterization of microelectronic, bio- and nano-technology materials and devices. I have designed hardware and software for - and/or instructed others on the use of - analysis techniques including but not limited to: SEM, XPS, XRD, AFM, SIMS, Raman, PL, Hall, IV, and CV.

Google Scholar
https://scholar.google.com/citations?hl=en&user=Sp--xe8AAAAJ&view_op=list_works&sortby=pubdate
LinkedIn The IEN/IMat Materials Characterization Facility (MCF)
Walter
Henderson
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