Walter Henderson

Walter Henderson

Walter Henderson

Associate Director, Materials Characterization Facility
Principal Research Scientist

Walter Henderson manages a group of 8-10 research professionals that annually trains and helps ~700 researchers to perform 25000+ hours of work that enables ~$30M in research funding to Georgia Tech. 

He has significant experience in the growth, fabrication, and especially the characterization of microelectronic and nano-scale materials and devices. Henderson has been involved in this type of research since 1998 at all levels from vacuum system design and assembly to data analysis to paper and proposal writing/submission. 

Henderson has been an author on more than 30 publications in refereed publications such as the Journal of Applied Physics. His long-term goal is to move into education policy or public policy at the local or state level. 

walter.henderson@ien.gatech.edu

404.894.4702

  • The IEN/IMat Materials Characterization Facility (MCF)
  • Google Scholar

    Additional Research:
    Specialties: Structural, chemical, electrical and optical characterization of microelectronic, bio- and nano-technology materials and devices. I have designed hardware and software for - and/or instructed others on the use of - analysis techniques including but not limited to: SEM, XPS, XRD, AFM, SIMS, Raman, PL, Hall, IV, and CV.

    IRI Connections:

    David Gottfried

    David Gottfried

    David Gottfried

    Regents' Researcher and Associate Director of External User Programs
    Director, NNCI Coordinating Office
    Director, SENIC

    David Gottfried received a Bachelor of Science in chemistry (highest distinction, highest honors) in 1984 from the University of Michigan and continued his studies in physical chemistry at Stanford University under a National Science Foundation graduate fellowship, obtaining his Ph.D. in 1991. He then was a European Molecular Biology Organization post-doctoral fellow at the Weizmann Institute of Science/Bar-Ilan University before beginning research and teaching in biophysics at the Albert Einstein College of Medicine. In 1999 he moved to the Georgia Tech Research Institute where he designed and tested optical sensors for chemical and biological agents with food safety, environmental, and homeland security applications. Gottfried joined the Microelectronics Research Center in 2007, where he was a technical liaison and biomedical domain expert for the NSF-funded National Nanotechnology Infrastructure Network. Beginning in 2012 he served as a member of the Advanced Technology Team in the Institute for Electronics and Nanotechnology (IEN) and then was appointed Senior Assistant Director for IEN Nanotechnology Technical Programs in 2016. He is currently the IMS Associate Director of External User Programs, Director for the Southeastern Nanotechnology Infrastructure Corridor (SENIC), a member site of the National Nanotechnology Coordinated Infrastructure (NNCI), and Director for the NNCI Coordinating Office. Gottfried was selected as a Fellow of the American Chemical Society in 2012 and the American Association for the Advancement of Science in 2018. In 2021 he was named a Regents' Researcher by the Board of Regents of the University System of Georgia.

    dsgottfried@gatech.edu

    404.894.0479

    Office Location:
    Marcus 1141

    Southeastern Nanotechnology Infrastructure Corridor (SENIC)

  • National Nanotechnology Coordinated Infrastructure (NNCI)
  • Google Scholar

    University, College, and School/Department
    Additional Research:
    Point-of-Care DiagnositcsChemical and Biological SensorsInk-jet Printing & Applications

    IRI Connections: