The Keyence VK-X3000 3D Surface Profiler, which performs non-contact profile, roughness, and film thickness measurements with nanometer-level resolution on any material or shape. Unlike other 3D measurement systems, objects with steep angles or low-reflectivity can be accurately measured. It is the world’s first optical profiler to offer a triple scan approach, allowing users three different scanning methods in a single device: laser confocal, focus variation, and white light interferometry. The VK-X3000 also offers guaranteed measurement accuracy, high-speed scanning, and optimized optics to eliminate aberration.